Our Services
ICP-MS TESTING
Using the latest technology in equipment and software available.
TESTING ENVIRONMENT
CMT utilizes a class 10 cleanroom environment for all extractions and testing.
TRACE METAL ANALYSIS
We provide accurate and precise analysis of trace metal contaminants on semiconductor tool components.
VPD WAFER TESTING
VPD Wafer Testing for 300 MM, 200 MM, and 100 MM bare silicon wafers. Please contact for additional information.
CUSTOM SEMICONDUCTOR EQUIPMENT TESTING
Trace metal analysis is CMT's specialty which includes testing varying materials and 3D dimensions based on your engineering specifications.
UPW PRODUCTS FOR TRACE METAL ANALYSIS
We provide UPW products for trace metal analysis from our in-house ultrapure water system COA.
CLIENT ONSITE TRACE METAL SAMPLING
We provide onsite client sampling for trace metal analysis.
TURNAROUND TIME
Standard turnaround is 3 business days from the date of sample receipt for most sample analyses. We also offer expedited turnaround times
(please contact for further info).